Open Technology Forum

Wednesday 24 October 2012

Day 2

10:15 : 16:30
Durability testing
Day 2 Wednesday 24 October 2012

Improved shifter durability test cell
Mr Darrel Huff, president, Huff Technologies Inc

Embracing virtual development and testing of ECU embedded software
Mr Vivek Jaikamal, engineering manager, ETAS, Inc.

OBD communications standards: a view from the field
Mr Robert Gruszczynski, senior OBD specialist, Volkswagen of America

Wheel force transducer usage made easy
Mr Andrew Cook, senior project engineer, Michigan Scientific Corporation

Making the most of your field data in the lab
Mr Jordan Van Baren, domestic sales manager, Vibration Research Corporation

Creating the perfect storm in the name of innovation
Mr John Komar, ACE director of Engineering and Operations, Automotive Centre of Excellence (ACE)

Requirements of modern data acquisition for vehicle testing
Mr Raimund Trummer, director product marketing, Dewetron

Understanding key technologies in a high-performance in-vehicle data logger
Mr Jim Schwartz, product marketing engineer, National Instruments

CrankSmart: accurate combustion analysis with an OE crank position sensor
Mr Samuel Olesky, engine applications specialist, Kistler North America

New MTS steer actuator enables low-torque high-fidelity EPS steering simulation
Mr Erik Nafstad, application engineer, MTS System Corp

MEMS Sensor Testing for Automotive Safety Systems
Mr Robert Mitchell, Advanced Systems Manager, Ideal Aerosmith

Understanding and using load cells with today's data acquisition systems
Mr Chris Novak, application engineer, Honeywell Test & Measurement

CAN-FD: the future of CAN technology
Mr Rick Lotoczky, product line director, Vector CANtech Inc

Handling the data explosion from GBs to peta bytes
Dr Gerald Sammer, global product manager, AVL

Effective HIL based testing utilizing synchronized measurement, simulation and control
Mr Russell Wallace, technical services, imc DataWorks, LLC