Downloads for Automotive Testing Expo North America 2017

* Note: a very small number of speakers wished to retain copyright on their presentations, and thus their paper does not appear here.

DAY 3

Thursday, October 26, 2017

Smart cars need smart testing: optimizing your EMC testing

Carl Mueller
System Engineer, Amplifier Research

Automotive component 'transducerization'

Domenic El-Achkar
Engineering Manager, HITEC Sensor Solutions Inc

Test and automation of today’s complex ECUs in all development stages

Stefan Kasek
Senior Lead Engineer, TraceTronic Inc

6D motion analysis from a single lenticular marker and high-speed 2D polarization imaging of stress in transparent materials

Andrew Bridges
Director Of New Business, Photron USA Inc

Ultra-portable NVH data recorder with CANbus

Kiran Kumar Kandula
Automotive Application Engineer, Brüel & Kjær North America

A breakthrough in accelerometer design for automotive safety testing

Ronald Poff
Principal Engineer, Test & Measurement Group, Meggitt Sensing Systems

Five steps to make better decisions from your data

Daniel Parrott
Software Product Marketing Engineer, National Instruments

An open systems architecture approach to BMS HIL testing

Steven Hoenig
BTS Unit Leader, Bloomy

Experimental measurement uncertainty for test chambers for AC systems

Gursaran Mathur
Senior Manager, CalsonicKansei North America

Development system and support system for autonomous driving vehicle

Hirosuke Suzuki
President, Keycom Corp


Note: You will need Adobe's Acrobat Reader to open the conference downloads on your PC or Mac.

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