Downloads for Automotive Testing Expo North America 2017
* Note: a very small number of speakers wished to retain copyright on their presentations, and thus their paper does not appear here.
DAY 1 PM
Tuesday, October 24, 2017
CIeNET’s automated testing solutions for next-generation vehicles
Robert Wicks
Managing Director, CIeNET
Bidirectional high-dynamic test bench energy systems
Markus Zacherl
Global Sales Director, Heinzinger Electronic GmbH
Optimization of calibration parameters in physics-based ECU models
Tobias Gutjahr
Program Manager, ETAS Inc
The path to V2X using digital short-range communication
Cory White
North America Business Development Manager, Automotive Sector, Anritsu Company
Achieving zero defects in automotive electronic systems through advanced analytics
Michael Schuldenfrei
CTO, Optimal Plus
Mitigating the risk of battery testing in environmental chambers
Mark Chrusciel
Sales Director, Cincinnati Sub-Zero (CSZ)
Comparison of 24-bit ADC technologies
Dave Gallop
Senior Product Specialist, Hi-Techniques
Creating a safe infrastructure for automotive R&D testing
Jim Parker
President, Ino-Tek Inc
Navigating the Inmetro process for components in the Brazilian market
Fabio Sianga
Country Business Line Leader - Automotive, Intertek