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Thursday 10th November - AeroNDT Forum
SESSION MODERATOR: Bradley Gilliland, Aerospace Key Account Manager, North America, GE Inspection Technologies.
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10.10 - 10.30 An Aerospace application of CMOS Digital X-ray for high-energy, high resolution and very large format imaging.
Aerojet Corporation / Envision Product Design LLC
Co-Authors: Victor Marconcini, Aerojet Corporation. John A. Pursley, Envision Product Design LLC. |
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10.30 - 10.50 Leak Testing with Hydrogen on Aircraft Fuel Systems
Sensistor
Speaker: Rich Mizia -, Sensistor. |
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10.50 - 11.10 X-ray Diffraction Technology: The Current State-of-the-Art for Measuring Residual Stress in Aerospace Materials, Structures and Propulsion Components
Proto Mfg. Inc.
Speaker & Author: Michael Brauss - President, Proto Mfg Inc.
Authors: James Pineault - Lab Director, Proto Mfg Inc. Dr Mohammed Belassel - R&D Manager, Proto Mfg Inc. Robert Drake - Research Scientist, Proto Mfg Inc. |
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11.10 - 11.30 Pulsed Eddy CurRent Technology AND aerospace applications
GE Transportation
Speaker: Yuri Plotnikov - GE Global Research Center, Niskayuna NY . Tony Hocking - GE Inspection Technologies, St. Albans, UK . Flynn Spears - GE Inspection Technologies, Lewistown, PA. |
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11.30 - 11.50 NDT Activity During Structural Sampling and Teardown of the VC10 aircraft
AIME / RAF
Speaker & Author: Sgt Stan Elworthy - Non-Destructive Evaluation Team, RAF St Athan |
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11.50 - 12.20 A New Portable XRF Analyzer for Aerospace NDT
Thermo Electron Corporation, Portable Elemental Analysis
Speaker: Tom Anderson - Thermo Electron Corporation, Portable Elemental Analysis.
Speaker: Dr Volker Thomsen - Sr. Applications Scientist, Thermo Electron Corporation, Portable Elemental Analysis. |
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12.20 - 12.40 Data Management and Networking Solutions for RVI systems
Olympus Industrial
Speaker & Author : Laura Bustamante – Product Specialist, Olympus Industrial.
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12.40 - 1.00 PT and MT Visual Examinations of Part Internals Utilizing Compact CCD Sensor Technologies.
InterTest Inc / Pratt & Whitney
Authors: Bill Habermann – President, InterTest Inc & Brian MacCracken - Senior NDT Engineer, Pratt & Whitney. |
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Forum in Brief
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