OPEN TECHNOLOGY FORUM
DAY 1 | DAY 2 | DAY 3

 

DAY 1
Wednesday 26th February 2003

09.35 IFR, an Aeroflex Company, Wichita, KS, USA
Speaker: Mike Dawson, Regional Sales Specialist
Topic: Flight Line Testing for Navigation and Communications Systems with the newest IFR Avionics Ramp Test Solution.
10.00 EADS Test & Services, Toulouse, France
Speaker: Moses Koyabe, Marketing and Business Development Director
Topic: A new OEM test solution for avionics Design, Production and Repair
10.25 EMC Partner AG, Laufen, Switzerland
Speaker: Martin Lutz
Topic: Induced lightning tests in accordance with DO-160 and MIL 461
10.50 GE Druck Messtechnik GmbH, Bad Nauheim, Germany
Speaker: David Dean, AGSE Product Support Manager, Druck Ltd
Topic: Flightline Maintenance of RVSM
11.15 Aerodata AG, Braunschweig, Germany
Speaker: Dr Axel Hoff. Co-authors: Dr Laurent Assembe, Oliver Kraft & Matthias Cremer
Topic: The Accuracy Verification of the Static Pressure for the RVSM Compliance of Aircraft.
11.40 D-Marchiori, Lazio, Italy
Speaker: Carlo Marchiori, President
Topic: Latest technology in instrument pressure calibration to comply with the new and more stringent requirements for RVSM (Reduced Vertical Minimum Separation)
12.05 Serco Test Systems, Waterlooville, Hants, UK
Speaker: Nick Martin, Chief Engineer, Serco Test Systems
Topic: 'Meeting the challenge of On Aircraft Testing of
Avionics Subsystems'
12.30 Creative Electronic Systems (CES), Grande Lancy, Switzerland
Speaker: Francois Worm, Director of Systems and Sales
Topic: An AFDX –Based Flight Test System
12.55 DIT-MCO International, Kansas City, MO, USA
Speaker: Ralph. D. Taylor, Director of Engineering
Topic: Automated Aerospace Fiber Optic Testing
1.15 LUNCH
2.00 EADS-Germany GmbH, Military Aircraft Business Unit, Munich, Germany
Speaker: Helmut Plankl, Senior Adv. Datacommunication, Test Instrumentation & Tools
Topic: System engineering, development and verification with AIDASS®- Ground Test Tools.
2.25 BETA-AIR JSC, Taganrog, Russia
Speakers: Victor V. Kobzev, Victor Ponomarenko
Topic: Outsourcing and “Pro Test” software for ATE as a cost
efficient solution.
2.50 Tech S.A.T GmbH, Poing, Germany
Speaker: Elmar Bartl
Topic: AFDX – A380 Data Bus. New Generation of Intelligent, High End Test Equipment.
3.15 Hobbs Engineering Corporation, Westminster, CO, USA
Speaker: Gregg K. Hobbs, Ph.D, P.E.
Topic: Why HALT and HASS should be used on Aerospace programs.
3.40 AMPOL Technologies Ltd, Israel
Speaker: Offer Fabian, VP Marketing & Business Development
Topic: Innovative approach to in-flight data analysis
4.05 Magellan Aerospace Corporation, Ontario, Canada
Speaker: David Bergen P.Eng, CET, Mechanical Engineer, Test Cell Engineering Group
Topic: Integrated Propulsion Test Technology from Magellan Aerospace.
4.30 Aero Systems Engineering Inc., St. Paul, MN, USA
Speaker: Bartley Blume, Test Cell Marketing Manager
Topic: Thermal Revolution: ASE 9046 Ethernet Intelligent Temperature Scanning Module.
4.55 Mapro Sistemas de Ensayo, S.A, Barcelona, Spain
Speaker: Carlos Arroyo
Topic: Digital control for multichannel servo hydraulic fatigue test systems.
5.20

ATTI-Europe B.V, The Netherlands
Speaker: Leo Steffens, Vice President
Topic: One ATE family for all electronic applications - a main column for economic survival

5.40 FINISH
Aerospace Testing Expo is organised by UK & International Press Events ©2002 UK & International Press